Adit Singh

Tom Wit

Rochit Rajsuman

"IEEE Computer Society Order Number PR02004"--T.p. verso.

Records of the 2003 IEEE International Workshop on Memory Technology, Design and Testing, 28-29 July, 2003, San Jose, California

Manoj Singh Gaur

Mark Zwolinski

Vijay Laxmi

D. Boolchandani

Virendra Sing

This book constitutes the refereed proceedings of the 17th International Symposium on VLSI Design and Test, VDAT 2013, held in Jaipur, India, in July 2013. The 44 papers presented were carefully reviewed and selected from 162 submissions. The papers discuss the frontiers of design and test of VLSI components, circuits and systems. They are organized in topical sections on VLSI design, testing and verification, embedded systems, emerging technology.

17th International Symposium, VDAT 2013, Jaipur, India, July 27-30, 2013, Proceedings

VLSI Design and Test

Singh Manoj Gaur

Adit Singh

About

Books

Join the club