Stephen J. Pearton

Osamu Ueda

Materials and Reliability Handbook for Semiconductor Optical and Electron Devices provides comprehensive coverage of reliability procedures and approaches for electron and photonic devices. These include lasers and high speed electronics used in cell phones, satellites, data transmission systems and displays. Lifetime predictions for compound semiconductor devices are notoriously inaccurate due to the absence of standard protocols. Manufacturers have relied on extrapolation back to room temperature of accelerated testing at elevated temperature. This technique fails for scaled, high current density devices. Device failure is driven by electric field or current mechanisms or low activation energy processes that are masked by other mechanisms at high temperature. The Handbook addresses reliability engineering for III-V devices, including materials and electrical characterization, reliability testing, and electronic characterization. These are used to develop new simulation technologies for device operation and reliability, which allow accurate prediction of reliability as well as the design specifically for improved reliability. The Handbook emphasizes physical mechanisms rather than an electrical definition of reliability. Accelerated aging is useful only if the failure mechanism is known. The Handbook also focuses on voltage and current acceleration stress mechanisms.

Materials and Reliability Handbook for Semiconductor Optical and Electron Devices

Timothy Clark

Art Institute of Chicago

Timothy A. R. Clark

Art institute (Chicago, Ill.).

Donald Jenkins

The floating world--the closely related pleasure and entertainment districts of Tokyo in the eighteenth and nineteenth centuries--embodied and idealized fashion, chic, and urbanity for its habituees, and inspired a profusion of woodblock prints depicting renowned courtesans and adored matinee idols. Considered ephemera in their time, these prints are treasured works of art today. In this volume of floating world prints (ukiyo-e), the authors present a selection of Kabuki actor portraits and theater scenes from The Art Institute of Chicago's world-renowned Buckingham Collection of Japanese Prints. Together with interpretive essays that place the prints in their historical and cultural context, the authors offer a catalog of 880 prints, 136 of them in color, containing the most complete and up- to-date information available about each print. Donald Jenkins's essay explains printmaking and explores the lives and milieu of the Katsukawa school print makers. Timothy Clark, in his essay, vividly depicts the world of Kabuki theater and describes a particular production of a popular play, from the vantage points of various participants. Osamu Ueda has provided dates and identification for the subjects of many of the prints in the collection, as well as biographies of the leading Kabuki actors and brief lives of the printmakers of the Katsukawa school.

Print Makers of the Katsukawa School

The Actor's Image

In developing III-V optical devices for use in optical fiber communication systems, digital-audio systems, and optical printers, reliability is paramount. Understanding the origins and causes of degradation is critical to successful design. This unique book focuses specifically on helping researchers and engineers involved in III-V compound semiconductor thin film growth and processing better understand the mechanism of degradation and details the major degradation modes of optical devices fabricated from three different systems. The book explains the character of defects and imperfections induced during material growth and fabrication, presents techniques for failure analysis, and describes methods for elimination of defect-generating mechanisms. More than 200 illustrations and 40 equations help clarify important concepts.

Osamu Ueda

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