Léon Poliakov

Christian Delacampagne

Patrick Girard

16 Kap. zur Anatomie, Geschichte u. Deutung d. Rassenwahns

Über den Rassismus

Shimon Peres

Ex Israeli Premier Shimon Peres takes us on an imaginary trip around Israel with Zionist leader Theodore Herzl. Together they contrast their impressions of this young country.

With Theodor Herzl in Israel

The Imaginary Voyage

Olivier Roy

Mathieu Marion

This volume is a collation of original contributions from the key actors of a new trend in the contemporary theory of knowledge and belief, that we call “dynamic epistemology”. It brings the works of these researchers under a single umbrella by highlighting the coherence of their current themes, and by establishing connections between topics that, up until now, have been investigated independently. It also illustrates how the new analytical toolbox unveils questions about the theory of knowledge, belief, preference, action, and rationality, in a number of central axes in dynamic epistemology: temporal, social, probabilistic and even deontic dynamics.

Dynamic Formal Epistemology

Nicola Nicolici

Xiaoqing Wen

Managing the power consumption of circuits and systems is now considered one of the most important challenges for the semiconductor industry. Elaborate power management strategies, such as dynamic voltage scaling, clock gating or power gating techniques, are used today to control the power dissipation during functional operation. The usage of these strategies has various implications on manufacturing test, and power-aware test is therefore increasingly becoming a major consideration during design-for-test and test preparation for low power devices. This book explores existing solutions for power-aware test and design-for-test of conventional circuits and systems, and surveys test strategies and EDA solutions for testing low power devices.

Power-Aware Testing and Test Strategies for Low Power Devices

Fidèle au serment de vengeance fait à son père Hamilcar, Hannibal Barca décide de réaliser une audacieuse offensive en menant la guerre sur le territoire romain. En 218 av. J.-C., à la tête d'une armée hétéroclite, composée de guerriers carthaginois, de cavaliers numides, de frondeurs baléares, de mercenaires gaulois ou ibères et d'éléphants de combat, le jeune général quitte l'Espagne punique pour une incroyable épopée. Après avoir traversé les Pyrénées avec près de 100 000 hommes, il franchit le Rhône, puis gravit les Alpes avant d'affronter les légions romaines à la Trébie et à Cannes. Hannibal accumule les exploits et vole de victoire en victoire. Bientôt, ses troupes campent sous les remparts de Rome, la fière cité aux sept collines. Mais un adversaire acharné se dresse contre Hannibal : Scipion, brillant général romain. Entre les deux hommes qui se respectent et s'admirent, la lutte est désormais implacable. Cette nouvelle guerre punique va ensanglanter la Méditerranée pendant près de dix-sept ans. Deuxième volume de la trilogie des Barca, Hannibal, Sous les remparts de Rome, nous fait revivre l'extraordinaire aventure de l'un des plus formidables conquérants de l'Antiquité. Né en 1950, Patrick Girard est historien. Il a été attaché de recherches au CNRS et est aujourd'hui journaliste. Familier de la Tunisie et de son histoire, il est l'auteur de Hamilcar, le lion des sables.

Sous les remparts de Rome

Le Roman de Carthage, t.II : Hannibal

Alberto Bosio

Luigi Dilillo

Serge Pravossoudovitch

Arnaud Virazel

Modern electronics depend on nanoscaled technologies that present new challenges in terms of testing and diagnostics. Memories are particularly prone to defects since they exploit the technology limits to get the highest density. This book is an invaluable guide to the testing and diagnostics of the latest generation of SRAM, one of the most widely applied types of memory. Classical methods for testing memory are designed to handle the so-called "static faults," but these test solutions are not sufficient for faults that are emerging in the latest Very Deep Sub-Micron (VDSM) technologies. These new fault models, referred to as "dynamic faults", are not covered by classical test solutions and require the dedicated test sequences presented in this book.

Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies

Advanced Test Methods for SRAMs

Patrick Girard

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