Secondary Ion Mass Spectrometry SIMS XII ; Proceedings of the Twelfth International Conference on Secondary Ion Mass Spectrometry (SIMS XII), Université Catholique de Louvain, Brussels, Belgium, September 5-10, 1999

Hardbound. This biennial conference series is the first international forum covering developments in Secondary Ion Mass Spectrometry. All aspects of the most recent developments in SIMS were covered by the scientific program: fundamentals, instrumentation, methodology, and analytical applications in different fields (semiconductors, polymer and organic materials, life sciences, environmental sciences, earth sciences, materials science). Related techniques and topics were also included.