Developments in Materials Characterization Technologies Symposium Held 23 and 24 July 1995, During the 28th Annual Technical Meeting of the International Metallographic Society, Albuquerque, New Mexico, USA

A wide range of topics were covered at this symposium including case histories of materials characterization utilizing techniques such as LOM, SEM, TEM, and Auger. Plus there's a review of the many important refinements made to the light optical microscope. This 136-page book also looks at the development of powerful image analysis due to personnel computers and digital imaging technology, as well as new approaches for characterizing the spatial arrangement of fibers under directional fiber composites using image analysis. You'll find an overview of the many sources of structural, compositional, and crystallographic information obtainable with the scanning electron microscope. In addition to history of EDS development, there's a review of back scattered electron Kikuchi patterns generated with the SEM provided phase identification and crystal orientation. Analytical approaches for converting x-ray counts to chemical analysis results (EMPS), the development and transformation of the TEM microscope to AEM, and analytical electron and atom probe field ion microscopy are also discussed at great length.The theory of XRD residual stress measurements and the use of energy-dispersive spectroscopy for mapping chemistry over large areas are covered along with the unique aspects of Auger electrons that facilitate surface chemistry characterization.